| Part Number: X2864AEMB 35 C6148 | Manufacturer: Xicor Ltd | NSN: 5962-01-233-2299 (5962012332299) | |
| Item Name : Microcircuit Memory | CAGE Code: 60395 | FSC: 5962 Microcircuits Electronic | |
| Alternate P/N : X2864AEMB35C6148 | |||
| 1710 | 04-26-2024 | ||
We are pleased to inform you that part number X2864AEMB 35 C6148 is currently in stock. To receive a quote, please fill out the form below with all necessary information. This part number X2864AEMB 35 C6148, with NSN 5962012332299, is manufactured by Xicor Ltd. We will respond to your quote request within just 15 minutes.
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An experienced and dedicated sale representative will contact you within 15 minutes with a quote. For any other questions related to Part X2864AEMB 35 C6148, or to expedite your response, please feel free to call us at +1 (714) 705-4780, or email your Bill of Materials (BOM) to sales@veritableaviation.com. We are here to help 24/7, 365 days a year.
| MRC | Criteria | Characteristic |
|---|---|---|
| MEMORY | ADAQ | BODY LENGTH0 560 INCHES MAXIMUM |
| MEMORY | ADAT | BODY WIDTH0 458 INCHES MAXIMUM |
| MEMORY | ADAU | BODY HEIGHT0 105 INCHES MAXIMUM |
| MEMORY | AEHX | MAXIMUM POWER DISSIPATION RATING770 0 MILLIWATTS |
| MEMORY | AFGA | OPERATING TEMP RANGE-55 0 TO 125 0 DEG CELSIUS |
| MEMORY | AFJQ | STORAGE TEMP RANGE-65 0 TO 150 0 DEG CELSIUS |
| MEMORY | CBBL | FEATURES PROVIDEDELECTROSTATIC SENSITIVE AND HERMETICALLY SEALED AND MONOLITHIC AND ERASABLE AND PROGRAMMABLE AND WENABLE |
| MEMORY | CQSJ | INCLOSURE MATERIALCERAMIC |
| MEMORY | CQSZ | INCLOSURE CONFIGURATIONLEADLESS FLAT PACK |
| MEMORY | CQWX | OUTPUT LOGIC FORMN-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
| MEMORY | CQZP | INPUT CIRCUIT PATTERN24 INPUT |
| MEMORY | CRHL | BIT QUANTITY65536 |
| MEMORY | CSWJ | WORD QUANTITY8192 |
| MEMORY | CWSG | TERMINAL SURFACE TREATMENTSOLDER |
| MEMORY | CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC-1 0 VOLTS MINIMUM POWER SOURCE AND 6 0 VOLTS MAXIMUM POWER SOURCE |
| MEMORY | CZEQ | TIME RATING PER CHACTERISTIC350 00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME LOW TO HIGH LEVEL OUTPUT AND 350 00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME HIGH TO LOW LEVEL OUTPUT |
| MEMORY | CZER | MEMORY DEVICE TYPEROM |
| MEMORY | TEST | TEST DATA DOCUMENT96906-MIL-STD-883 STANDARD INCLUDES INDUSTRY OR ASSOCIATION STANDARDS INDIVIDUAL MANUFACTUREER STANDARDS ETC |
| MEMORY | TTQY | TERMINAL TYPE AND QUANTITY32 LEADLESS |
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